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The world of electron microscopy has undergone a revolution in recent years with leaps in the performance of electron optical elements, sources and detectors. While instruments are becoming ever more powerful their complexity is also multiplied. This trend places renewed emphasis on facilities that gather in one place state-of-the-art instrumentation and world-leading experts in the field. 

The Research Resource Center (RRC) at UIC was one such pioneer, opening the frontiers of electron microscopy to the scientific community in 1998 with the highest resolution 200 kV scanning transmission electron microscope in the United States. Recently, they have completed the installation of the JEOL JEM-ARM200CF, which is again the highest resolution 200 kV STEM/TEM in the USA, and will be accessible to users starting January 2012.

To celebrate the launch of the JEOL JEM-ARM200CF, a ceremony will take place on Friday, 20 January 2012, starting at 9.30 AM with addresses from Joe Garcia (VCR), Dean Astrida Tantillo (LAS) and Dean Peter Nelson (COE). An Open House of the RRC-East (845 West Taylor Street) with tours of the facility will be held thereafter. 

For more information see the attached flyer or visit:
wiki.rrc.uic.edu/wiki/RRC-EMS:_New_Microscope

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Inauguration Ceremony