Dear All, Please note that the registration deadline for Seeing at the Nanoscale has been extended to 4/16/13. To register, please use this link: http://www.nuance2013.northwestern.edu/NU%20Registration%20SNS%202013.html. **Please note, the registration fee is waived for Northwestern University**. [Bruker Header (840x168)] REGISTER TODAY!<http://r20.rs6.net/tn.jsp?e=001Qx_BBbjAeDniqjgukS3_ytpigMp1k-VhaSy2E_F9tFoiMSArl0YKH_Dt50Ge7_j3n4DWuKQvZhZSFe6_CbpKDS3_v8r5NDkcrUMxxU_MkxZL_ODSC_wk5j-BmLv6-b9peTIbvFtKtZ8uzoXvWRS-6v1Ds7rihx92DviNaBebcyzmJjU8t9_pjcXCfS7H-dOIyLNxvThXbNwU9Z_jfChzlmbAc2995hPsDFVkY6ARtVn0AvT5VEc_aTzBFNABZf9zcNvwO5Gc0G3ZCTy8DGyIUPG3_dfBCRi-IRQBXMlrO7De7G0JTMbLzJXAw6mgrXyOt9SLStaJbGzsd6TfYm5-0tIezI3M5lu-0mn7udu7iKg=> The Seeing at the Nanoscale annual conference will focus on nanostructural imaging, characterization, and modification using scanning probe microscopy (SPM) and related techniques. Don't miss this opportunity to meet your peers, discover next-generation nanotechnology, and be the first to hear about the exciting trends and industry updates. This year's conference features an incredible mix of visionaries-all ready to give you an insider's view on the future of nanotechnology. If you're a user of SPM-or interested in nanotechnology-join nanoscience researchers from around the world at this year's Seeing at the Nanoscale. The event includes 1 full day of technical presentations and posters, as well as numerous opportunities to interact and collaborate with the conference organizers and participants. Click here<http://r20.rs6.net/tn.jsp?e=001Qx_BBbjAeDkWd1SH1_D9LBnPB0VOTVzRqbtolCg7xW4BeDi9vnLI63VQh_Epg1LFNEKoG0dcLBMmssxUIni9KufNC-tHQDVivNAJx1gizjiAm58QzIFyXNfeYdQC1I8DAWBVl-7CiUuEVb_Fr0-SOBC-nSv4sJNKVrPQl4kJXkrIqupg1B7N-Gm-OmtrSX3HkZ5FEcMaWPNtifLdp6aDGAKuUNECyXzFPQUIO4xryRprRfPxhYyY9nAi0Fm_Xm2riL2pdpYWtZCjrKpe1o4Rs-egMm3PB-UlbTUl8AqwNDDuWnUp-iCRfJElhispI3jwilk36hr_C28f8w1VOa8uJ_qy69rtCQmV1RLV6o06UOS8CfYRii2Irg==> to download the Agenda Location: Norris University Center, Northwestern University, 1999 Campus Dr., Evanston, IL ________________________________ CALL FOR PAPERS (Posters only) - Abstract Deadline Extended: April 16th Don't miss the opportunity to share your research among peers and experts in nanotechnology. Now accepting abstracts for the following Technical Sessions: Session I: Photovoltaics and Green Energy Session II: Quantitative Nanoscale Measurements Session III: Ultra High Resolution Imaging Session IV: New Probe Instrumentation - From High Speed to Chem ID Poster contest awards for 1st ($1,500), 2nd ($1,000) and 3rd place ($500) winners! Submission Guidelines * Deadline for abstract submissions is Tuesday, April 16, 2013 at 5:00 p.m. CST. Presenters must register for the conference. * You may submit more than one abstract (submit each one separately via email<mailto:[log in to unmask]>). * Abstracts must be 200 words or less. * Each abstract should contain a sentence stating the study objective; a brief statement of methods, if applicable; a summary of results obtained; and a statement of conclusions. * Please prepare your abstract in a Microsoft Word document in Times New Roman, 10-point font. * Ensure that all graphics and tables in your abstract measure less than 3-inches width. There is a limit of 2 images for each abstract and the total abstract file size cannot exceed 1MB. To increase your chances of acceptance we suggest you include at least one graphic and/or plot showing your key results. * Use standard abbreviations for units of measure. Other abbreviations should be spelled out in full at first mention, followed by the abbreviation in parentheses. * All abstracts must be submitted on-line. Please include general contact and abstract information and upload a Microsoft Word format version (recommended if you include graphics) as an email attachment. * You will receive email notification within 24 hours of your abstract submission. If you do not receive confirmation of your submission, email<mailto:[log in to unmask]>. ________________________________ AFM TUTORIAL SESSIONS Bruker will be conducting four parallel sessions on Thursday, April 18 focusing on exciting new SPM applications and recent technology developments. Product demonstrations on: BioScope Catalyst, Dimension FastScan, MultiMode 8, and Dimension Icon. Click here<http://r20.rs6.net/tn.jsp?e=001Qx_BBbjAeDkWd1SH1_D9LBnPB0VOTVzRqbtolCg7xW4BeDi9vnLI63VQh_Epg1LFNEKoG0dcLBMmssxUIni9KufNC-tHQDVivNAJx1gizjiAm58QzIFyXNfeYdQC1I8DAWBVl-7CiUuEVb_Fr0-SOBC-nSv4sJNKVrPQl4kJXkrIqupg1B7N-Gm-OmtrSX3HkZ5FEcMaWPNtifLdp6aDGAKuUNECyXzFPQUIO4xryRprRfPxhYyY9nAi0Fm_Xm2riL2pdpYWtZCjrKpe1o4Rs-egMm3PB-UlbTUl8AqwNDDuWnUp-iCRfJElhispI3jwilk36hr_C28f8w1VOa8uJ_qy69rtCQmV1RLV6o06UOS8CfYRii2Irg==> for the Schedule (see page 2 for tutorial agenda). Don't delay. REGISTER TODAY<http://r20.rs6.net/tn.jsp?e=001Qx_BBbjAeDmmaPKvoQ7KxFYj9d1H8zfK2v8QQku89-qEmrSPg57-Z_1C7tu8bg_tAF7Z0Ixz5TD2s7EcwPuPa4BqUI8J8omru3fNPVBxdZrScL7m2zAGawiodkAu-sBOc8e9P27D3TsTpLhqyNK2ePl4hZQxxtgBgvBkz9ZvnfGNOzZTBdlH_0B2DXOSUM_iKkAi5sQNZnS7xOluuF_Kf7DpBmTxaHTb0z7YMqIxVJoXMKXXBaOEg1E4q8GYCNojCFWAlQqEpfxijCU19_tydEYMSJIy1YwBS8ewZTAujQt0KEOv48qE_MUM8XUYhxmv-GXtHN4uNleGUlixMe3UMJmUoJrzvX9->! _________________________________________________________________________ For complete event information, please visit our Seeing at the Nanoscale 2013 website<http://r20.rs6.net/tn.jsp?e=001Qx_BBbjAeDlA6b9EQ1Go_rPHvRNwzUGu3Z_0OjF8TSM6ih4neUN_6NfnIBj8Ebsla8U9yPOsl6MLgKEnUtKkbE0a5Pw1nNstHDO4yhS0Vqu9ehrljj2YCLDlfAWriBUO48hWldNzl36Htja84n0sf2W1C-SQoC6HcqKB1fAEG8dzLM-P-AJMqcnyltFOORflxJYGrkecv965_TwplViI4OZ_2gQAqEANqmbEpEyNPWYD6lzICfTtAbp-bKbjMMHW0QQZbdNKQjCdC4ICLBQz4nplrbXuYePUXkVSLIClGm4=> [http://ih.constantcontact.com/fs192/1110108263716/img/49.png] Bruker Nano Surfaces Division - AFM Business 112 Robin Hill Road Santa Barbara, CA 93117, USA Tel. +1 (805)967-1400 Fax +1 (805)967-7717 [log in to unmask]<http://r20.rs6.net/tn.jsp?e=001Qx_BBbjAeDmD7OaCkPpy-c__2HX_4XSTkCEEXzTxKMOcqAXG6SD4Nu3Z5rolMDvnIqVhH4gBAn6Nfx4JGyyXuVCu3TsBTz9sLb5YW6yG-NRsJkc5aT-9fWw_aPAa3EjxWnet3LfmThWkzccIjyk4SVw6o573tTk5gRk5xPT7TyEQnvjXVsHP4CYuI-q1wyqsLR8wmu2VFXwI1_YkM6QxenYxakl3M5N7V1dc4fiPq7ls9MYfcIm4IA94u305bm5o> www.bruker.com<http://r20.rs6.net/tn.jsp?e=001Qx_BBbjAeDlZmnBsR41ady7S-xlZnYjknSBW7fJzs7TPM0EjpiOt9H3RB3XGoXG_210WWIsScfo2B3zFI9masFzcRuV0Qe6y3AVJCODpNUxSXY-Rvyuwq7WZbH0DKthKIXxeN6_Y82nFOPdZwaeANNMomUffWjRIRgNYdPh1a76Lwiy6ySW0w-V2SSUWTFpgD08Qa0JxLaZbBXmj1CYC8b4fluKRE6rxgzFO9UKMHEDEjuhJtDS4awLG6MBuBnkM> All Contents ©2013 Bruker Corporation. 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