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REGISTER
TODAY!
The Seeing at the Nanoscale annual conference will focus on nanostructural
imaging, characterization, and modification using scanning probe microscopy (SPM) and related techniques.
Don't miss this opportunity to meet your peers, discover next-generation nanotechnology, and be the first to hear about the exciting
trends and industry updates. This year's conference features an incredible mix of visionaries-all ready to give you an insider's view on the future of nanotechnology. If you're a user of SPM-or interested in nanotechnology-join nanoscience researchers from
around the world at this year's Seeing at the Nanoscale.
The event includes 1 full day of technical presentations and posters, as well as numerous opportunities to interact and collaborate with
the conference organizers and participants.
Click
here to download the Agenda
Location: Norris University Center, Northwestern University,
1999 Campus Dr., Evanston, IL
CALL FOR PAPERS (Posters only) - Abstract Deadline
Extended: April 16th
Don't miss the opportunity to share your research among peers and experts in nanotechnology.
Now accepting abstracts for the following Technical Sessions:
Session I:
Photovoltaics and Green Energy
Session II:
Quantitative Nanoscale Measurements
Session III: Ultra High Resolution Imaging
Session IV: New Probe Instrumentation - From High Speed to Chem ID
Poster contest awards for 1st ($1,500), 2nd ($1,000) and 3rd place ($500) winners!
Submission Guidelines
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Deadline for abstract submissions is Tuesday, April 16, 2013 at 5:00 p.m. CST. Presenters must register for the conference.
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You may submit more than one abstract (submit each one separately via
email).
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Abstracts must be 200 words or less.
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Each abstract should contain a sentence stating the study objective; a brief statement of methods, if applicable; a summary of results obtained; and a statement of conclusions.
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Please prepare your abstract in a Microsoft Word document in Times New Roman, 10-point font.
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Ensure that all graphics and tables in your abstract measure less than 3-inches width. There is a limit of 2 images for each abstract and the total abstract file size cannot exceed 1MB. To increase your chances
of acceptance we suggest you include at least one graphic and/or plot showing your key results.
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Use standard abbreviations for units of measure. Other abbreviations should be spelled out in full at first mention, followed by the abbreviation in parentheses.
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All abstracts must be submitted on-line. Please include general contact and abstract information and upload a Microsoft Word format version (recommended if you include graphics) as an email attachment.
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You will receive email notification within 24 hours of your abstract submission. If you do not receive confirmation of your submission,
email.
AFM TUTORIAL SESSIONS
Bruker will be conducting four parallel sessions on Thursday, April 18 focusing on exciting new SPM applications and recent technology
developments. Product demonstrations on: BioScope Catalyst, Dimension FastScan, MultiMode 8, and Dimension Icon.
Click
here for the Schedule (see page 2 for tutorial agenda).
Don't delay.
REGISTER TODAY!
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For complete event information, please visit our
Seeing
at the Nanoscale 2013 website
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